DV and DT Limitation of SCRS
Product Code : JL-PET-1416
DV And DT Limitation Of SCRS
- Test Dv/Dt estimation of the SCR..
- Compare Dv/Dt capability by gate-cathode terminations
- Compare Dv/Dt capability by gate-cathode biasing (voltage biasing).
- Compare Dv/Dt capability by gate-cathode biasing (current biasing).
- To improve Dv/Dt capability by transistor snubber circuit.
- Effect of R.C. snubber circuit on Dv/Dt capability.
- Study of different scheme of R.C. Snubber circuit on Dv/Dt capability.
Built in parts:
- 300 V D.C. at 250 mA, power supply internally connected.
- Thyristor switch for applying sudden voltage on the SCR under experiment.
- The SCR under experiment.
- Resistance for gate-cathode termination.
- Silicon diode.
- Transistorized snubber circuit.
- Two schemes for R-C snubber circuits.
- Visual indication to indicate SCR firing.
- Adequate no. of other electronic components.
- Mains ON/OFF switch, fuse and jewel light.
- The unit is operative on 230 V ±10% at 50 Hz A.C. mains.
- Adequate no. of patch cords stackable 4 mm spring loaded plug length ½ meter.
- Good quality, reliable terminal/sockets are provided at appropriate places on panel for connections/ observation of waveforms.
- Strongly supported by detailed operating instructions, giving details of object, theory, design procedures, report suggestions and book references.
- 3 kg. (approx.)
- W 340 x H 110 x D 210
Other apparatus required:
- Digital multimeter 3¾ digit - order code 16901
- 0-30 V, 1 amp IC regulated power supply
Pay Mode Terms:
- T/T (Bank Transfer)
Port of Dispatch:
- 4 weeks
- Corrugated Box
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