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Optical Interferometer Manufacturer,Supplier and Exporter in India

Product Code : JL-SOMLE-8931
Jlab Export is a leading Optical Interferometer Manufacturer,and suppliers in Africa, Optical Interferometer Uruguay (Montevideo), Optical Interferometer Uzbekistan (Tashkent), Optical Interferometer Venezuela (Caracas), Optical Interferometer Vietnam (Hanoi), Optical Interferometer Yemen (Sana'a), Optical Interferometer Zambia (Lusaka), Zimbabwe (Harare), Eswatini (Mbabane) (Lobamba), Ethiopia (Addis Ababa), Fiji (Suva), Gabon (Libreville), Gambia (Banjul), Georgia (Tbilisi), Ghana (Accra), India (Delhi, Mumbai, Kolkatta, Chennai), Indonesia (Jakarta), Iraq (Baghdad), Ivory Coast (Yamoussoukro), Jamaica (Kingston), Jordan (Amman), Kazakhstan (Astana), Kenya (Nairobi), Kiribati (Tarawa), Kosovo (Pristina), Kuwait (Kuwait City), Kyrgyzstan (Bishkek), Laos (Vientiane), Latvia (Riga), Lebanon (Beirut), Lesotho (Maseru), Liberia (Monrovia), Libya (Tripoli), Lithuania (Vilnuis), Luxembourg (Luxembourg), Malawi (Lilongwe), Malaysia (Federal Territory of Kuala Lumpur), Maldives (Malle), Mali (Federal Territory of Kuala Lumpur), Malta (Male), Mauritania (Nouakchott), Mauritius (Port Louis), Mexico (Mexico City), Mongolia (Ulaanbaatar), Bulgaria (Sofia), Burkina Faso (Ouagadougou), Burundi (Gitega), Cambodia (Phnom Penh), Cameroon (Yaoundé), Cape Verde (Praia), Central African Republic (Bangui), Chad (N'Djamena), Chile (Santiago), Colombia (Bogota), Comoros (Moroni), Congo (Kinshasa), Costa Rica (San José), Croatia (Zagreb), Cuba (Havana), Cyprus (Nicosia), Czech Republic (Prague), Denmark (Copenhagen) ,Djibouti (Djibouti City), Dominican Republic (Santo Domingo), DR Congo (Kinshasa), Ecuador (Quito), Egypt (Cairo), El Salvador (San Salvador), Equatorial Guinea (Malabo), Eritrea (Asmara), Estonia (Tallinn)

Optical Interferometer

Measurement capacity:-

0 to 100 mm.

Measurement uncertainty:-

below Â±0, 03 Âµm

Functions:-

For making precise measurements for beams of light of such factors as length, surface irregularities, and index of refraction.

Information derived from fringe measurements is used for precise wavelength determinations, measurement of very small distances and thicknesses, the study of spectrum lines, and determination of refractive indices of transparent materials.

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